Automated probe microscopy via evolutionary optimization at the atomic scale
نویسندگان
چکیده
We use numerical simulations to investigate the effect of electrostatics on the source and drain contacts of carbon nanotube field‐effect transistors. We find that unscreened charge on the nanotube at the contact‐channel interface leads to a potential barrier that can significantly hamper transport through the device. This effect is largest for intermediate gate voltages and for contacts near the ohmic‐Schottky crossover, but can be mitigated with a reduction in the gate oxide thickness. These results help to elucidate the important role that contact geometry plays in the performance of carbon nanotube electronic devices.
منابع مشابه
Comparing of Routine Nano-particles for Creating Pattern Using Genetic Algorithm and Particle Swarm Optimization - Ant System in Simulation using Atomic Force Microscopy
Pattern creating with nano-particle is one of the best application methods in nano-scale that it will be used for new pattern creating and make micro/nano-electromechanical System (MEMS/NEMS) in future. Particle swarm optimization algorithm is one of evolutionary computation techniques and the optimization method based on population and ant algorithm, optimization algorithm is modeled based on ...
متن کاملHigh Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...
متن کاملNanometer-Scale Patterning on PMMA Resist by Force Microscopy Lithography
Nanoscale science and technology has today mainly focused on the fabrication of nano devices. In this paper, we study the use of lithography process to build the desired nanostructures directly. Nanolithography on polymethylmethacrylate (PMMA) surface is carried out by using Atomic Force Microscope (AFM) equipped with silicon tip, in contact mode. The analysis of the results shows that the ...
متن کاملObservation of Nanoscale Refractive Index Contrast via Photoinduced Force Microscopy
Near-field optical microscopy (NSOM) is a scanning probe technique that allows optical imaging of sample surfaces with nanoscale resolution. Generally, all NSOM schemes rely on illuminating the sample surface and collecting the localized scattered light resulting from the interaction of the microscopes nanoscale probe with the sample surface in the illuminated region. Currently, a new set of na...
متن کاملShape Reconstruction Based on a New Blurring Model at the Micro/Nanometer Scale
Real-time observation of three-dimensional (3D) information has great significance in nanotechnology. However, normal nanometer scale observation techniques, including transmission electron microscopy (TEM), and scanning probe microscopy (SPM), have some problems to obtain 3D information because they lack non-destructive, intuitive, and fast imaging ability under normal conditions, and optical ...
متن کامل